International symposium on quality electronic design : proceedings : 18-21 March 2002 : San Jose, California. : Mar 2002, San Jose, CA.

• Material Type: 図書
• ISBN: 0769515614; 0769515622 (case); 0769515630 (microfiche)
• Title: International symposium on quality electronic design : proceedings : 18-21 March 2002 : San Jose, California. : Mar 2002, San Jose, CA.
• Author Heading: International Symposium on Quality Electronic Design (3rd : 2002 : San Jose, California)
• Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
• Publication Date: c2002.
• Publication Date (W3CDTF): 2002
• Extent: xxii, 549 p. : ill. ; 28 cm.
• Alternative Title: Proceedings of the ISQED 2002 : 2002 3rd international symposium on quality electronic design : 18-21 March 2002 : San Jose, California
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• NDLC: M17
• Note (General): Programme and papers.; IEEE cat no PR01561.
• Note (Bibliography): Includes bibliographic references and author index.
• Note (Additional Physical Form Available): Also available via the World Wide Web.
• Holding library: 国立国会図書館
• Call No.: M17-03-4463
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000004235349; http://id.ndl.go.jp/bib/000004235349
• LC Control Number: 2002101055; https://lccn.loc.gov/2002101055
• RLIN No.: NYCGAUK9776-B
• Bibliographic Record Category (NDL): 215