Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA.
(Memory Technology, Design and Testing)
国立国会図書館請求記号
M17-04-1660
国立国会図書館書誌ID
000004261543
資料種別
図書
著者
IEEE International Workshop on Memory Technology, Design and Testing (11th : 2003 : San Jose, California)