Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA. (Memory Technology, Design and Testing)

Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA.

(Memory Technology, Design and Testing)

Call No. (NDL): M17-04-1660
Bibliographic ID of National Diet Library: 000004261543

Material type: 図書

Author: IEEE International Workshop on Memory Technology, Design and Testing (11th : 2003 : San Jose, California)

Publisher: IEEE Computer Society

Publication date: c2003.

Material Format: Paper

Capacity, size, etc.: ix, 95 p. : ill. ; 28 cm.

NDC: -

View All

Notes on use

Note (General)：: Papers.IEEE cat no PR02004.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type: 図書
ISBN: 0769520049
ISSN (series): 1087-4852
Title: Records of the 2003 international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose California. : MTDT-03, the 11th annual IEEE international workshop on memory technology, design and testing : 11th annual meeting of the MTDT workshop : MTDT 2003 : Jul 2003, San Jose, CA.
Series Title: Memory Technology, Design and Testing
Author Heading: IEEE International Workshop on Memory Technology, Design and Testing (11th : 2003 : San Jose, California)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: ix, 95 p. : ill. ; 28 cm.
Alternative Title: Records of the 2003 IEEE international workshop on memory technology, design and testing : 28-29 July 2003 : San Jose, California
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductor storage devices -- Testing. -- Congresses.
Random access memory -- Congresses.
NDLC: M17
Note (General): Papers.
IEEE cat no PR02004.
Note (Bibliography): Includes bibliographic references and author index.
Note (Additional Physical Form Available): Also available via the World Wide Web.
Holding library: 国立国会図書館
Call No.: M17-04-1660
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004261543
http://id.ndl.go.jp/bib/000004261543
RLIN No.: MOHG52962806-B
Bibliographic Record Category (NDL): 215