Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.

• 資料種別: 図書
• ISBN: 0818605200 (pbk.); 0818685204; 0818645202 (microfiche)
• タイトル: Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.
• 著者標目: IEEE Computer Society. Test Technology Committee.; IEEE Computer Society.; Curriculum for Test Technology Workshop (1983 : University of Minnesota, Minneapolis)
• 出版事項: Silver Spring, MD : IEEE Computer Society Press; Los Angeles, CA : Order from IEEE Computer Society
• 出版年月日等: c1983.
• 出版年（W3CDTF）: 1983
• 数量: vii, 173 p. : ill. ; 28 cm.
• 並列タイトル等: Test technology.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Testing -- Study and teaching -- Congresses.
• LCC: TK7874
• DDC: 621.381/73/0287
• NDLC: ND386
• 一般注記: Proceedings of the Curriculum for Test Technology Workshop.; "[Sponsored by] the Institute of Electrical and Electronics Engineers, Inc., IEEE Computer Society."; "IEEE catalog number 83CH1978-6."; "IEEE Computer Society order number 520."
• 書誌注記: Includes bibliographies and index.
• 所蔵機関: 国立国会図書館
• 請求記号: ND386-36
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000006164913; http://id.ndl.go.jp/bib/000006164913
• LC control number: 83082756; https://lccn.loc.gov/83082756
• 整理区分コード: 211