Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.

• Material Type: 図書
• ISBN: 0818605200 (pbk.); 0818685204; 0818645202 (microfiche)
• Title: Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 / IEEE Computer Society Test Technology Committee.
• Author Heading: IEEE Computer Society. Test Technology Committee.; IEEE Computer Society.; Curriculum for Test Technology Workshop (1983 : University of Minnesota, Minneapolis)
• Publication, Distribution, etc.: Silver Spring, MD : IEEE Computer Society Press; Los Angeles, CA : Order from IEEE Computer Society
• Publication Date: c1983.
• Publication Date (W3CDTF): 1983
• Extent: vii, 173 p. : ill. ; 28 cm.
• Alternative Title: Test technology.
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Testing -- Study and teaching -- Congresses.
• LCC: TK7874
• DDC: 621.381/73/0287
• NDLC: ND386
• Note (General): Proceedings of the Curriculum for Test Technology Workshop.; "[Sponsored by] the Institute of Electrical and Electronics Engineers, Inc., IEEE Computer Society."; "IEEE catalog number 83CH1978-6."; "IEEE Computer Society order number 520."
• Note (Bibliography): Includes bibliographies and index.
• Holding library: 国立国会図書館
• Call No.: ND386-36
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000006164913; http://id.ndl.go.jp/bib/000006164913
• LC Control Number: 83082756; https://lccn.loc.gov/83082756
• Bibliographic Record Category (NDL): 211