Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.

• 資料種別: 図書
• ISBN: 0780377222
• タイトル: Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.
• 著者標目: Institute of Electrical and Electronics Engineers. Reliability/CPMT/ED Singapore Chapter.; Ho, Philip.; International Symposium on the Physical & Failure Analysis of Integrated Circuits (10th : 2003 : Singapore)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2003.
• 出版年（W3CDTF）: 2003
• 数量: 216 p. : ill. ; 30 cm.
• 並列タイトル等: Proceedings of the 10th international symposium on the physical and failure analysis of integrated circuits : IPFA 2003; IPFA 2003 : proceedings : 10th international symposium on the physical & failure analysis of integrated circuits : Scheduled: 7 to 11 July 2003 : Singapore
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing. -- Congresses.
• NDLC: M17
• 一般注記: Papers.; IEEE cat no 03TH8662.
• 書誌注記: Includes bibliographic references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-04-2068
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000007322385; http://id.ndl.go.jp/bib/000007322385
• LC control number: 2002115581; https://lccn.loc.gov/2002115581
• RLIN番号: MOHG52875880-B
• 整理区分コード: 215