Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.

• Material Type: 図書
• ISBN: 0780377222
• Title: Proceedings of the 10th international symposium on the physical & failure analysis of integrated circuits : IPFA 2003. : Jul 2003, Singapore.
• Author Heading: Institute of Electrical and Electronics Engineers. Reliability/CPMT/ED Singapore Chapter.; Ho, Philip.; International Symposium on the Physical & Failure Analysis of Integrated Circuits (10th : 2003 : Singapore)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2003.
• Publication Date (W3CDTF): 2003
• Extent: 216 p. : ill. ; 30 cm.
• Alternative Title: Proceedings of the 10th international symposium on the physical and failure analysis of integrated circuits : IPFA 2003; IPFA 2003 : proceedings : 10th international symposium on the physical & failure analysis of integrated circuits : Scheduled: 7 to 11 July 2003 : Singapore
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing. -- Congresses.
• NDLC: M17
• Note (General): Papers.; IEEE cat no 03TH8662.
• Note (Bibliography): Includes bibliographic references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-04-2068
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000007322385; http://id.ndl.go.jp/bib/000007322385
• LC Control Number: 2002115581; https://lccn.loc.gov/2002115581
• RLIN No.: MOHG52875880-B
• Bibliographic Record Category (NDL): 215