Proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits : IPFA 2004. : 11th IEEE international symposium on the physical and failure analysis of integrated circuits : Jul 2004, Taipei, Taiwan.

• 資料種別: 図書
• ISBN: 0780384547
• タイトル: Proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits : IPFA 2004. : 11th IEEE international symposium on the physical and failure analysis of integrated circuits : Jul 2004, Taipei, Taiwan.
• 著者標目: IEEE Electron Devices Society. Taipei Chapter.; Chung, Steve S.; International Symposium on the Physical & Failure Analysis of Integrated Circuits (11th : 2004 : Taipei, Taiwan)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2004.
• 出版年（W3CDTF）: 2004
• 数量: 326 p. : ill. ; 30 cm.
• 並列タイトル等: Proceedings of the 11th international symposium on the physical and failure analysis of integrated circuits : IPFA 2004; IPFA 2004 : proceedings : 11th international symposium on the physical & failure analysis of integrated circuits : July 5-8 2004, Taiwan
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing. -- Congresses.
• NDLC: M17
• 一般注記: Papers and abstracts.; IEEE cat no 04TH8743.
• 書誌注記: Includes bibliographic references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-05-2126
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000007925630; http://id.ndl.go.jp/bib/000007925630
• LC control number: 2004103511; https://lccn.loc.gov/2004103511
• RLIN番号: MOHG56672484-B
• 整理区分コード: 215