Proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits : IPFA 2004. : 11th IEEE international symposium on the physical and failure analysis of integrated circuits : Jul 2004, Taipei, Taiwan.

• Material Type: 図書
• ISBN: 0780384547
• Title: Proceedings of the 11th international symposium on the physical & failure analysis of integrated circuits : IPFA 2004. : 11th IEEE international symposium on the physical and failure analysis of integrated circuits : Jul 2004, Taipei, Taiwan.
• Author Heading: IEEE Electron Devices Society. Taipei Chapter.; Chung, Steve S.; International Symposium on the Physical & Failure Analysis of Integrated Circuits (11th : 2004 : Taipei, Taiwan)
• Publication, Distribution, etc.: Piscataway : IEEE
• Publication Date: c2004.
• Publication Date (W3CDTF): 2004
• Extent: 326 p. : ill. ; 30 cm.
• Alternative Title: Proceedings of the 11th international symposium on the physical and failure analysis of integrated circuits : IPFA 2004; IPFA 2004 : proceedings : 11th international symposium on the physical & failure analysis of integrated circuits : July 5-8 2004, Taiwan
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing. -- Congresses.
• NDLC: M17
• Note (General): Papers and abstracts.; IEEE cat no 04TH8743.
• Note (Bibliography): Includes bibliographic references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-05-2126
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000007925630; http://id.ndl.go.jp/bib/000007925630
• LC Control Number: 2004103511; https://lccn.loc.gov/2004103511
• RLIN No.: MOHG56672484-B
• Bibliographic Record Category (NDL): 215