Materials, technology and reliability of advanced interconnects -- 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A. : symposium B, "materials, technology and reliability of advanced interconnects" : 2005 MRS spring meeting : Mar 2005, San Francisco, CA.

• 資料種別: 図書
• ISBN: 1558998160
• タイトル: Materials, technology and reliability of advanced interconnects -- 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A. : symposium B, "materials, technology and reliability of advanced interconnects" : 2005 MRS spring meeting : Mar 2005, San Francisco, CA.
• シリーズタイトル: Materials Research Society Symposia Proceedings ; 863
• タイトル標目: Materials Research Society symposia proceedings ; v. 863.
• 著者標目: Besser, Paul R.; Materials Research Society. Meeting (2005 : San Francisco, Calif.); Symposim on Materials, Technology and Reliability of Advanced Interconnects (2005 : San Francisco, Calif.)
• 出版事項: Warrendale : Materials Research Society
• 出版年月日等: c2005.
• 出版年（W3CDTF）: 2005
• 数量: xiii, 411 p. : ill. ; 24 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Semiconductors -- Congresses.; Semiconductors -- Junctions -- Congresses.; Dielectric films -- Congresses.; Integrated circuits -- Materials -- Congresses.; Integrated circuits -- Reliability -- Congresses.
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and indexes.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-05-2608
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008002259; http://id.ndl.go.jp/bib/000008002259
• RLIN番号: CSUGA6062551-B
• 整理区分コード: 215