Materials, technology and reliability of advanced interconnects -- 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A. : symposium B, "materials, technology and reliability of advanced interconnects" : 2005 MRS spring meeting : Mar 2005, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 863)

Materials, technology and reliability of advanced interconnects -- 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A. : symposium B, "materials, technology and reliability of advanced interconnects" : 2005 MRS spring meeting : Mar 2005, San Francisco, CA.

(Materials Research Society Symposia Proceedings ; 863)

Call No. (NDL): M17-05-2608
Bibliographic ID of National Diet Library: 000008002259

Material type: 図書

Author: Besser, Paul R.ほか

Publisher: Materials Research Society

Publication date: c2005.

Material Format: Paper

Capacity, size, etc.: xiii, 411 p. : ill. ; 24 cm.

NDC: -

Notes on use

Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 1558998160
Title: Materials, technology and reliability of advanced interconnects -- 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A. : symposium B, "materials, technology and reliability of advanced interconnects" : 2005 MRS spring meeting : Mar 2005, San Francisco, CA.
Series Title: Materials Research Society Symposia Proceedings ; 863
Title Heading: Materials Research Society symposia proceedings ; v. 863.
Author Heading: Besser, Paul R.
Materials Research Society. Meeting (2005 : San Francisco, Calif.)
Symposim on Materials, Technology and Reliability of Advanced Interconnects (2005 : San Francisco, Calif.)
Publication, Distribution, etc.: Warrendale : Materials Research Society
Publication Date: c2005.
Publication Date (W3CDTF): 2005
Extent: xiii, 411 p. : ill. ; 24 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors -- Congresses.
Semiconductors -- Junctions -- Congresses.
Dielectric films -- Congresses.
Integrated circuits -- Materials -- Congresses.
Integrated circuits -- Reliability -- Congresses.
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and indexes.
Holding library: 国立国会図書館
Call No.: M17-05-2608
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008002259
http://id.ndl.go.jp/bib/000008002259
RLIN No.: CSUGA6062551-B
Bibliographic Record Category (NDL): 215