6th international symposium on quality electronic design : proceedings : March 21-23, 2005 San Jose, California. : ISQED05 : Mar 2005, San Jose, CA.

• 資料種別: 図書
• ISBN: 0769523013
• タイトル: 6th international symposium on quality electronic design : proceedings : March 21-23, 2005 San Jose, California. : ISQED05 : Mar 2005, San Jose, CA.
• 著者標目: International Symposium on Quality Electronic Design (6th : 2005 : San Jose, California)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2005.
• 出版年（W3CDTF）: 2005
• 数量: xxiii, 710 p. : ill. ; 28 cm.
• 並列タイトル等: Proceedings of the IEEE ISQED 2005 : ISQED 2005 : 2005 : 6th international symposium on quality electronic design : March 21-23, 2005 : San Jose, CA; ISQED proceedings
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Reliability. -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction. -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design. -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• NDLC: M17
• 一般注記: Program, abstracts, and papers.; IEEE cat no P2301.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-06-260
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008035289; http://id.ndl.go.jp/bib/000008035289
• LC control number: 2004117594; https://lccn.loc.gov/2004117594
• RLIN番号: MOHG58793733-B
• 整理区分コード: 215