6th international symposium on quality electronic design : proceedings : March 21-23, 2005 San Jose, California. : ISQED05 : Mar 2005, San Jose, CA.

• Material Type: 図書
• ISBN: 0769523013
• Title: 6th international symposium on quality electronic design : proceedings : March 21-23, 2005 San Jose, California. : ISQED05 : Mar 2005, San Jose, CA.
• Author Heading: International Symposium on Quality Electronic Design (6th : 2005 : San Jose, California)
• Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
• Publication Date: c2005.
• Publication Date (W3CDTF): 2005
• Extent: xxiii, 710 p. : ill. ; 28 cm.
• Alternative Title: Proceedings of the IEEE ISQED 2005 : ISQED 2005 : 2005 : 6th international symposium on quality electronic design : March 21-23, 2005 : San Jose, CA; ISQED proceedings
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Very large scale integration -- Reliability. -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction. -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design. -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• NDLC: M17
• Note (General): Program, abstracts, and papers.; IEEE cat no P2301.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-06-260
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000008035289; http://id.ndl.go.jp/bib/000008035289
• LC Control Number: 2004117594; https://lccn.loc.gov/2004117594
• RLIN No.: MOHG58793733-B
• Bibliographic Record Category (NDL): 215