Optical test and measurement technology and equipment : 2nd international symposium on advanced optical manufacturing and testing technologies : 2-5 November 2005 : Xian, China. : 2nd international symp. on adv. optical manufac. and testing tech.: optical test and measurement tech. and equip. : Nov 2005, Xian, China.

• 資料種別: 図書
• ISBN（セット）: 081946189X (set)
• ISSN（シリーズ）: 0277-786X
• タイトル: Optical test and measurement technology and equipment : 2nd international symposium on advanced optical manufacturing and testing technologies : 2-5 November 2005 : Xian, China. : 2nd international symp. on adv. optical manufac. and testing tech.: optical test and measurement tech. and equip. : Nov 2005, Xian, China.
• シリーズタイトル: SPIE Proceedings ; 6150
• タイトル標目: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 6150.
• 著者標目: Chinese Optical Society (COS) . Committee of Optical Manufacturing Technology.; Hou, Xun.; International Symposium on Advanced Optical Manufacturing Technologies (2nd : 2005 : Xian, China)
• 出版事項: Bellingham : SPIE
• 出版年月日等: c2006.
• 出版年（W3CDTF）: 2006
• 数量: 2 parts : ill. ; 28 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Optical materials -- Testing -- Congresses.; Optical measurements -- Congresses.; Mensuration. -- Congresses.
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-06-1105
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008163621; http://id.ndl.go.jp/bib/000008163621
• RLIN番号: MOHG64671884-B
• 整理区分コード: 215