Optical test and measurement technology and equipment : 2nd international symposium on advanced optical manufacturing and testing technologies : 2-5 November 2005 : Xian, China. : 2nd international symp. on adv. optical manufac. and testing tech.: optical test and measurement tech. and equip. : Nov 2005, Xian, China. (SPIE Proceedings ; 6150)

Optical test and measurement technology and equipment : 2nd international symposium on advanced optical manufacturing and testing technologies : 2-5 November 2005 : Xian, China. : 2nd international symp. on adv. optical manufac. and testing tech.: optical test and measurement tech. and equip. : Nov 2005, Xian, China.

(SPIE Proceedings ; 6150)

Call No. (NDL): M17-06-1105
Bibliographic ID of National Diet Library: 000008163621

Material type: 図書

Author: Chinese Optical Society (COS) . Committee of Optical Manufacturing Technology.ほか

Publisher: SPIE

Publication date: c2006.

Material Format: Paper

Capacity, size, etc.: 2 parts : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN (set): 081946189X (set)
ISSN (series): 0277-786X
Title: Optical test and measurement technology and equipment : 2nd international symposium on advanced optical manufacturing and testing technologies : 2-5 November 2005 : Xian, China. : 2nd international symp. on adv. optical manufac. and testing tech.: optical test and measurement tech. and equip. : Nov 2005, Xian, China.
Series Title: SPIE Proceedings ; 6150
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 6150.
Author Heading: Chinese Optical Society (COS) . Committee of Optical Manufacturing Technology.
Hou, Xun.
International Symposium on Advanced Optical Manufacturing Technologies (2nd : 2005 : Xian, China)
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2006.
Publication Date (W3CDTF): 2006
Extent: 2 parts : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Optical materials -- Testing -- Congresses.
Optical measurements -- Congresses.
Mensuration. -- Congresses.
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-06-1105
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008163621
http://id.ndl.go.jp/bib/000008163621
RLIN No.: MOHG64671884-B
Bibliographic Record Category (NDL): 215