Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops : SSPR 2006 and SPR 2006 : Hong Kong, China, August 17-19, 2006 : proceedings. : SSPR&SPR 2006 : Aug 2006, Hong Kong, China.

• 資料種別: 図書
• ISBN: 3540372369 (pbk.); 9783540372363 (ISBN-13)
• ISSN（シリーズ）: 0302-9743
• タイトル: Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops : SSPR 2006 and SPR 2006 : Hong Kong, China, August 17-19, 2006 : proceedings. : SSPR&SPR 2006 : Aug 2006, Hong Kong, China.
• シリーズタイトル: Lecture Notes in Computer Science ; 4109
• 著者標目: International Association for Pattern Recognition. Technical Committee 1.; Yeung, Dit-Yan, 1960-; International Association for Pattern Recognition. Technical Committee 2.; International Workshop on Structural and Syntactic Pattern Recognition (11th : 2006 : Hong Kong, China); International Workshop on Statistical Techniques in Pattern Recognition (6th : 2006 : Hong Kong, China)
• 出版事項: Berlin : Springer; New York : Springer
• 出版年月日等: c2006.
• 出版年（W3CDTF）: 2006
• 数量: xxi, 939 p. : ill. ; 24 cm.
• 並列タイトル等: S+SSPR 2006
• 出版地（国名コード）: DE
• 本文の言語コード: eng
• 件名標目: Pattern recognition systems -- Congresses.
• LCC: TK7882.P3
• NDLC: M17
• 一般注記: Papers.; " (...) , which was the fifth time that the SPR and SSPR workshops organized by (...) were held together as joint workshops." -- pref.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-06-3016
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008367027; http://id.ndl.go.jp/bib/000008367027
• LC control number: 2006930416; https://lccn.loc.gov/2006930416
• RLIN番号: MNUGA004880589-B
• 整理区分コード: 215