Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops : SSPR 2006 and SPR 2006 : Hong Kong, China, August 17-19, 2006 : proceedings. : SSPR&SPR 2006 : Aug 2006, Hong Kong, China. (Lecture Notes in Computer Science ; 4109)

Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops : SSPR 2006 and SPR 2006 : Hong Kong, China, August 17-19, 2006 : proceedings. : SSPR&SPR 2006 : Aug 2006, Hong Kong, China.

(Lecture Notes in Computer Science ; 4109)

Call No. (NDL): M17-06-3016
Bibliographic ID of National Diet Library: 000008367027

Material type: 図書

Author: International Association for Pattern Recognition. Technical Committee 1.ほか

Publisher: Springer

Publication date: c2006.

Material Format: Paper

Capacity, size, etc.: xxi, 939 p. : ill. ; 24 cm.

NDC: -

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Note (General)：: Papers." (...) , which was the fifth time that the SPR and SSPR workshops organized by (...) were held together as joint workshops." -- pref.

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Paper

Material Type: 図書
ISBN: 3540372369 (pbk.)
9783540372363 (ISBN-13)
ISSN (series): 0302-9743
Title: Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops : SSPR 2006 and SPR 2006 : Hong Kong, China, August 17-19, 2006 : proceedings. : SSPR&SPR 2006 : Aug 2006, Hong Kong, China.
Series Title: Lecture Notes in Computer Science ; 4109
Author Heading: International Association for Pattern Recognition. Technical Committee 1.
Yeung, Dit-Yan, 1960-
International Association for Pattern Recognition. Technical Committee 2.
International Workshop on Structural and Syntactic Pattern Recognition (11th : 2006 : Hong Kong, China)
International Workshop on Statistical Techniques in Pattern Recognition (6th : 2006 : Hong Kong, China)
Publication, Distribution, etc.: Berlin : Springer
New York : Springer
Publication Date: c2006.
Publication Date (W3CDTF): 2006
Extent: xxi, 939 p. : ill. ; 24 cm.
Alternative Title: S+SSPR 2006
Place of Publication (Country Code): DE
Text Language Code: eng
Subject Heading: Pattern recognition systems -- Congresses.
LCC: TK7882.P3
NDLC: M17
Note (General): Papers.
" (...) , which was the fifth time that the SPR and SSPR workshops organized by (...) were held together as joint workshops." -- pref.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-06-3016
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000008367027
http://id.ndl.go.jp/bib/000008367027
LC Control Number: 2006930416
https://lccn.loc.gov/2006930416
RLIN No.: MNUGA004880589-B
Bibliographic Record Category (NDL): 215