Third IEEE international workshop on electronic design, test and applications : proceedings : 17-19 January 2006 : Kuala Lumpur, Malaysia. : Jan 2006, Kuala Lumpur, Malaysia.

• 資料種別: 図書
• ISBN: 0769525008
• タイトル: Third IEEE international workshop on electronic design, test and applications : proceedings : 17-19 January 2006 : Kuala Lumpur, Malaysia. : Jan 2006, Kuala Lumpur, Malaysia.
• 著者標目: Girard, Patrick.; IEEE International Workshop on Electronic Design, Test and Applications (3rd : 2006 : Kuala Lumpur, Malaysia)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2006.
• 出版年（W3CDTF）: 2006
• 数量: xvii, 521 p. : ill. ; 28 cm.
• 並列タイトル等: 3rd IEEE international workshop on electronic design, test and applications : proceedings : 17-19 January 2006 : Kuala Lumpur, Malaysia; DELTA 2006 : third IEEE international workshop on electronic design, test & applications : 17-19 January 2006 : Kuala Lumpur, Malaysia
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Electronics -- Research -- Congresses.; Electronics -- Design -- Congresses.; Electronics -- Testing -- Congresses.
• LCC: TK7855
• NDLC: M17
• 一般注記: Papers.; IEEE cat no P2500.
• 書誌注記: Includes bibliographic references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-07-374
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008419049; http://id.ndl.go.jp/bib/000008419049
• RLIN番号: CSUGA6290100-B
• 整理区分コード: 215