Third IEEE international workshop on electronic design, test and applications : proceedings : 17-19 January 2006 : Kuala Lumpur, Malaysia. : Jan 2006, Kuala Lumpur, Malaysia.

• Material Type: 図書
• ISBN: 0769525008
• Title: Third IEEE international workshop on electronic design, test and applications : proceedings : 17-19 January 2006 : Kuala Lumpur, Malaysia. : Jan 2006, Kuala Lumpur, Malaysia.
• Author Heading: Girard, Patrick.; IEEE International Workshop on Electronic Design, Test and Applications (3rd : 2006 : Kuala Lumpur, Malaysia)
• Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
• Publication Date: c2006.
• Publication Date (W3CDTF): 2006
• Extent: xvii, 521 p. : ill. ; 28 cm.
• Alternative Title: 3rd IEEE international workshop on electronic design, test and applications : proceedings : 17-19 January 2006 : Kuala Lumpur, Malaysia; DELTA 2006 : third IEEE international workshop on electronic design, test & applications : 17-19 January 2006 : Kuala Lumpur, Malaysia
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Electronics -- Research -- Congresses.; Electronics -- Design -- Congresses.; Electronics -- Testing -- Congresses.
• LCC: TK7855
• NDLC: M17
• Note (General): Papers.; IEEE cat no P2500.
• Note (Bibliography): Includes bibliographic references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-07-374
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000008419049; http://id.ndl.go.jp/bib/000008419049
• RLIN No.: CSUGA6290100-B
• Bibliographic Record Category (NDL): 215