2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.

• 資料種別: 図書
• ISBN: 1424400341
• タイトル: 2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.
• 著者標目: Menon, Sankaran M.; IEEE International Workshop on Defect Based Testing (2005 : Palm Springs, Calif.); IEEE VLSI Test Symposium (2005 : Palm Springs, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2005.
• 出版年（W3CDTF）: 2005
• 数量: xi, 86, 1 p. : ill. ; 28 cm.
• 並列タイトル等: 2005 IEEE international workshop on current and defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA; IEEE international workshop on current & defect based testing : DBT 2005 : defect based testing : Palm Springs, CA; 2005 IEEE international workshop on defect based testing (DBT) : Palm Springs, CA : May 1, 2005
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Defects -- Congresses.; Iddq testing -- Congresses.; Metal oxide semiconductors, Complementary -- Congresses.
• NDLC: M17
• 一般注記: Abstracts and papers.; Held in conjunction with the VLSI Test Symposium (VTS2005) .; IEEE cat no 05EX1261.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-07-543
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000008435803; http://id.ndl.go.jp/bib/000008435803
• RLIN番号: CSUGA6298540-B
• 整理区分コード: 215