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図書

2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.

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2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.

Call No. (NDL)
M17-07-543
Bibliographic ID of National Diet Library
000008435803
Material type
図書
Author
Menon, Sankaran M.ほか
Publisher
IEEE
Publication date
c2005.
Material Format
Paper
Capacity, size, etc.
xi, 86, 1 p. : ill. ; 28 cm.
NDC
-
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Notes on use

Note (General)：

Abstracts and papers.Held in conjunction with the VLSI Test Symposium (VTS2005) .IEEE cat no 05EX1261.

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Paper

Material Type
図書
ISBN
1424400341
Title
2005 IEEE international workshop on current & defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA. : DBT-2005 : May 2005, Palm Springs, CA.
Author Heading
Menon, Sankaran M.
IEEE International Workshop on Defect Based Testing (2005 : Palm Springs, Calif.)
IEEE VLSI Test Symposium (2005 : Palm Springs, Calif.)
Publication, Distribution, etc.
Piscataway : IEEE
Publication Date
c2005.
Publication Date (W3CDTF)
2005
Extent
xi, 86, 1 p. : ill. ; 28 cm.
Alternative Title
2005 IEEE international workshop on current and defect based testing (DBT 2005) : proceedings : May 1, 2005 : Lodge at Rancho Mirage, Palm Springs, USA
IEEE international workshop on current & defect based testing : DBT 2005 : defect based testing : Palm Springs, CA
2005 IEEE international workshop on defect based testing (DBT) : Palm Springs, CA : May 1, 2005
Place of Publication (Country Code)
US