IOLTS 2007 : 13th IEEE international on-line testing symposium : proceedings : Heraklion, Crete, Greece : 8-11 July 2007. : tutorial on soft errors : IEEE Computer Society Test Technology Technical Council (TTTC) test technology educational program (TTEP) 2007 : Jul 2007, Heraklion, Greece.

• 資料種別: 図書
• ISBN: 0769529186; 9780769529189 (ISBN-13)
• タイトル: IOLTS 2007 : 13th IEEE international on-line testing symposium : proceedings : Heraklion, Crete, Greece : 8-11 July 2007. : tutorial on soft errors : IEEE Computer Society Test Technology Technical Council (TTTC) test technology educational program (TTEP) 2007 : Jul 2007, Heraklion, Greece.
• 著者標目: University of Athens.; IEEE International On-Line Testing Symposium (13th : 2007 : Herakleion, Greece)
• 出版事項: Los Alimitos : IEEE Computer Society
• 出版年月日等: c2007.
• 出版年（W3CDTF）: 2007
• 数量: xiii, 300 p . : ill. ; 28 cm.
• 並列タイトル等: 2007 13th IEEE international on-line testing symposium
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Electronic circuits -- Testing -- Data processing -- Congresses.; Error-correcting codes (Information theory) -- Congresses.
• NDLC: M17
• 一般注記: Abstracts and papers.; " (...) and included in the annual and expanding Test Technology Educational Program (TTEP) ." -- p. 3.; IEEE cat no P2908 (t.p. verso) , P2918 (backcover) .
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-07-2374
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009041761; http://id.ndl.go.jp/bib/000009041761
• LC control number: 2007927960; https://lccn.loc.gov/2007927960
• OCLC番号: 162149258; https://www.worldcat.org/oclc/162149258
• 整理区分コード: 215