IOLTS 2007 : 13th IEEE international on-line testing symposium : proceedings : Heraklion, Crete, Greece : 8-11 July 2007. : tutorial on soft errors : IEEE Computer Society Test Technology Technical Council (TTTC) test technology educational program (TTEP) 2007 : Jul 2007, Heraklion, Greece.

IOLTS 2007 : 13th IEEE international on-line testing symposium : proceedings : Heraklion, Crete, Greece : 8-11 July 2007. : tutorial on soft errors : IEEE Computer Society Test Technology Technical Council (TTTC) test technology educational program (TTEP) 2007 : Jul 2007, Heraklion, Greece.

Call No. (NDL): M17-07-2374
Bibliographic ID of National Diet Library: 000009041761

Material type: 図書

Author: University of Athens.ほか

Publisher: IEEE Computer Society

Publication date: c2007.

Material Format: Paper

Capacity, size, etc.: xiii, 300 p . : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Abstracts and papers." (...) and included in the annual and expanding Test Technology Educational Program (TTEP) ." -- p. 3.IEEE cat no P2908 (t.p. ve...

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Paper

Material Type: 図書
ISBN: 0769529186
9780769529189 (ISBN-13)
Title: IOLTS 2007 : 13th IEEE international on-line testing symposium : proceedings : Heraklion, Crete, Greece : 8-11 July 2007. : tutorial on soft errors : IEEE Computer Society Test Technology Technical Council (TTTC) test technology educational program (TTEP) 2007 : Jul 2007, Heraklion, Greece.
Author Heading: University of Athens.
IEEE International On-Line Testing Symposium (13th : 2007 : Herakleion, Greece)
Publication, Distribution, etc.: Los Alimitos : IEEE Computer Society
Publication Date: c2007.
Publication Date (W3CDTF): 2007
Extent: xiii, 300 p . : ill. ; 28 cm.
Alternative Title: 2007 13th IEEE international on-line testing symposium
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Electronic circuits -- Testing -- Data processing -- Congresses.
Error-correcting codes (Information theory) -- Congresses.
NDLC: M17
Note (General): Abstracts and papers.
" (...) and included in the annual and expanding Test Technology Educational Program (TTEP) ." -- p. 3.
IEEE cat no P2908 (t.p. verso) , P2918 (backcover) .
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-07-2374
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009041761
http://id.ndl.go.jp/bib/000009041761
LC Control Number: 2007927960
https://lccn.loc.gov/2007927960
OCLC No.: 162149258
https://www.worldcat.org/oclc/162149258
Bibliographic Record Category (NDL): 215