Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD.

• 資料種別: 図書
• ISBN: 9780735404410
• ISSN（シリーズ）: 0094-243X
• タイトル: Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD.
• シリーズタイトル: AIP Conference Proceedings ; 931
• タイトル標目: AIP conference proceedings ; no. 931.
• 著者標目: Seller, David G.; International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 : Gaithersburg, Md.)
• 出版事項: Melville : American Institute of Physics
• 出版年月日等: 2007.
• 出版年（W3CDTF）: 2007
• 数量: xiii, 578 p. : ill. (some col.) ; 28 cm.
• 付属資料: With a CD-ROM.
• 並列タイトル等: Frontiers of characterization and metrology for nanoelectronics: 2007 : March 27-29 : National Institute of Standards and Technology : Gaithersburg, Maryland
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Ultra large scale integration -- Congresses.; Nanoelectronics -- Congresses.
• NDLC: M17
• 一般注記: Papers.; "This was the sixth conference in a series; (...) " -- p. xii.
• 書誌注記: Includes bibliographical references and indexes.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-07-2846
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009133022; http://id.ndl.go.jp/bib/000009133022
• OCLC番号: 180097692; https://www.worldcat.org/oclc/180097692
• 整理区分コード: 215