Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD. (AIP Conference Proceedings ; 931)

Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD.

(AIP Conference Proceedings ; 931)

Call No. (NDL): M17-07-2846
Bibliographic ID of National Diet Library: 000009133022

Material type: 図書

Author: Seller, David G.ほか

Publisher: American Institute of Physics

Publication date: 2007.

Material Format: Paper

Capacity, size, etc.: xiii, 578 p. : ill. (some col.) ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers."This was the sixth conference in a series; (...) " -- p. xii.

Accompanying material：: With a CD-ROM.

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Paper

Material Type: 図書
ISBN: 9780735404410
ISSN (series): 0094-243X
Title: Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD.
Series Title: AIP Conference Proceedings ; 931
Title Heading: AIP conference proceedings ; no. 931.
Author Heading: Seller, David G.
International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 : Gaithersburg, Md.)
Publication, Distribution, etc.: Melville : American Institute of Physics
Publication Date: 2007.
Publication Date (W3CDTF): 2007
Extent: xiii, 578 p. : ill. (some col.) ; 28 cm.
Accompanying material: With a CD-ROM.
Alternative Title: Frontiers of characterization and metrology for nanoelectronics: 2007 : March 27-29 : National Institute of Standards and Technology : Gaithersburg, Maryland
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Ultra large scale integration -- Congresses.
Nanoelectronics -- Congresses.
NDLC: M17
Note (General): Papers.
"This was the sixth conference in a series; (...) " -- p. xii.
Note (Bibliography): Includes bibliographical references and indexes.
Holding library: 国立国会図書館
Call No.: M17-07-2846
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009133022
http://id.ndl.go.jp/bib/000009133022
OCLC No.: 180097692
https://www.worldcat.org/oclc/180097692
Bibliographic Record Category (NDL): 215