7th international symposium on quality electronic design : ISQED 2006 : proceedings : 27-29 March 2006 : San Jose, California. : ISQED tutorials : ISQED06 : ISQED 2006 conference : Mar 2006, San Jose, CA.

• 資料種別: 図書
• ISBN: 0769525237; 9780769525235 (ISBN-13)
• タイトル: 7th international symposium on quality electronic design : ISQED 2006 : proceedings : 27-29 March 2006 : San Jose, California. : ISQED tutorials : ISQED06 : ISQED 2006 conference : Mar 2006, San Jose, CA.
• 著者標目: International Symposium on Quality Electronic Design (7th : 2006 : San Jose, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2006.
• 出版年（W3CDTF）: 2006
• 数量: xvii, 824 p. : ill. ; 28 cm.
• 並列タイトル等: Proceedings of the IEEE ISQED 2006 : ISQED 2006 : 2006 7th international symposium on quality electronic design : 27-29 March 2006 : San Jose, CA; ISQED proceedings
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• LCC: TK7874.75
• DDC: 621.3815
• NDLC: M17
• 一般注記: Program, papers and abstracts.; IEEE cat no P2523.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-08-627
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009248646; http://id.ndl.go.jp/bib/000009248646
• LC control number: 2005937757; https://lccn.loc.gov/2005937757
• OCLC番号: 66386218; https://www.worldcat.org/oclc/66386218
• 整理区分コード: 215