7th international symposium on quality electronic design : ISQED 2006 : proceedings : 27-29 March 2006 : San Jose, California. : ISQED tutorials : ISQED06 : ISQED 2006 conference : Mar 2006, San Jose, CA.

• Material Type: 図書
• ISBN: 0769525237; 9780769525235 (ISBN-13)
• Title: 7th international symposium on quality electronic design : ISQED 2006 : proceedings : 27-29 March 2006 : San Jose, California. : ISQED tutorials : ISQED06 : ISQED 2006 conference : Mar 2006, San Jose, CA.
• Author Heading: International Symposium on Quality Electronic Design (7th : 2006 : San Jose, Calif.)
• Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
• Publication Date: c2006.
• Publication Date (W3CDTF): 2006
• Extent: xvii, 824 p. : ill. ; 28 cm.
• Alternative Title: Proceedings of the IEEE ISQED 2006 : ISQED 2006 : 2006 7th international symposium on quality electronic design : 27-29 March 2006 : San Jose, CA; ISQED proceedings
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• LCC: TK7874.75
• DDC: 621.3815
• NDLC: M17
• Note (General): Program, papers and abstracts.; IEEE cat no P2523.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-08-627
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000009248646; http://id.ndl.go.jp/bib/000009248646
• LC Control Number: 2005937757; https://lccn.loc.gov/2005937757
• OCLC No.: 66386218; https://www.worldcat.org/oclc/66386218
• Bibliographic Record Category (NDL): 215