Eighth international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007. : ISQED07 : ISQED 2007 conference : ISQED'07 tutorials : Mar 2007, San Jose, CA.

• 資料種別: 図書
• ISBN: 0769527957; 9780769527956 (ISBN-13)
• タイトル: Eighth international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007. : ISQED07 : ISQED 2007 conference : ISQED'07 tutorials : Mar 2007, San Jose, CA.
• 著者標目: International Symposium on Quality Electronic Design (8th : 2007 : San Jose, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2007.
• 出版年（W3CDTF）: 2007
• 数量: xxv, 929 p. : ill. ; 28 cm.
• 並列タイトル等: 8th international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007; Proceedings of the IEEE ISQED 2007 : ISQED 2007 : 2007 : 8th international symposium on quality electronic design : 26-28 March 2007 : San Jose, CA; ISQED proceedings
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
• LCC: TK7874.75
• DDC: 621.39/5
• NDLC: M17
• 一般注記: Program, abstracts and papers.; Held in conjunction with ISQED exhibition.; IEEE cat no P2795.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-09-4
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009746037; http://id.ndl.go.jp/bib/000009746037
• LC control number: 2006939397; https://lccn.loc.gov/2006939397
• OCLC番号: 138289590; https://www.worldcat.org/oclc/138289590
• 整理区分コード: 215