Eighth international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007. : ISQED07 : ISQED 2007 conference : ISQED'07 tutorials : Mar 2007, San Jose, CA.

Eighth international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007. : ISQED07 : ISQED 2007 conference : ISQED'07 tutorials : Mar 2007, San Jose, CA.

Call No. (NDL): M17-09-4
Bibliographic ID of National Diet Library: 000009746037

Material type: 図書

Author: International Symposium on Quality Electronic Design (8th : 2007 : San Jose, Calif.)

Publisher: IEEE Computer Society

Publication date: c2007.

Material Format: Paper

Capacity, size, etc.: xxv, 929 p. : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Program, abstracts and papers.Held in conjunction with ISQED exhibition.IEEE cat no P2795.

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Paper

Material Type: 図書
ISBN: 0769527957
9780769527956 (ISBN-13)
Title: Eighth international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007. : ISQED07 : ISQED 2007 conference : ISQED'07 tutorials : Mar 2007, San Jose, CA.
Author Heading: International Symposium on Quality Electronic Design (8th : 2007 : San Jose, Calif.)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2007.
Publication Date (W3CDTF): 2007
Extent: xxv, 929 p. : ill. ; 28 cm.
Alternative Title: 8th international symposium on quality electronic design : ISQED 2007 : proceedings : San Jose, California : 26-28 March 2007
Proceedings of the IEEE ISQED 2007 : ISQED 2007 : 2007 : 8th international symposium on quality electronic design : 26-28 March 2007 : San Jose, CA
ISQED proceedings
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.
Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.
Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.
Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
LCC: TK7874.75
DDC: 621.39/5
NDLC: M17
Note (General): Program, abstracts and papers.
Held in conjunction with ISQED exhibition.
IEEE cat no P2795.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-09-4
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009746037
http://id.ndl.go.jp/bib/000009746037
LC Control Number: 2006939397
https://lccn.loc.gov/2006939397
OCLC No.: 138289590
https://www.worldcat.org/oclc/138289590
Bibliographic Record Category (NDL): 215