11th international congress and exhibition on experimental and applied mechanics 2008 : June 2-5, 2008 : Orlando, Florida, USA. : 9th international symposium on MEMS and nanotechnology : international symposium of electronics/MEMS packaging and reliability : international symposium on optical metrology in industrial, medical, and daily life applications : linking theory and computations to experimental symposium : SEM 11 international congress & exposition on experimental and applied mechanics experimental mechanics applied to damage: detection, analysis and mitigation : Jun 2008, Orlando, FL.

• 資料種別: 図書
• ISBN（セット）: 9781605604152 (set)
• タイトル: 11th international congress and exhibition on experimental and applied mechanics 2008 : June 2-5, 2008 : Orlando, Florida, USA. : 9th international symposium on MEMS and nanotechnology : international symposium of electronics/MEMS packaging and reliability : international symposium on optical metrology in industrial, medical, and daily life applications : linking theory and computations to experimental symposium : SEM 11 international congress & exposition on experimental and applied mechanics experimental mechanics applied to damage: detection, analysis and mitigation : Jun 2008, Orlando, FL.
• 著者標目: International Congress and Exhibition on Experimental and Applied Mechanics (11th : 2008 : Orlando, Fla.)
• 出版事項: Bethel : Society for Experimental Mechanics
• 出版年月日等: [2008]
• 出版年（W3CDTF）: 2008
• 数量: 4 v. : ill. ; 28 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Mechanics, Applied -- Congresses.
• LCC: TA349
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-09-540
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000009758508; http://id.ndl.go.jp/bib/000009758508
• OCLC番号: 262583848; https://www.worldcat.org/oclc/262583848
• 整理区分コード: 215