11th international congress and exhibition on experimental and applied mechanics 2008 : June 2-5, 2008 : Orlando, Florida, USA. : 9th international symposium on MEMS and nanotechnology : international symposium of electronics/MEMS packaging and reliability : international symposium on optical metrology in industrial, medical, and daily life applications : linking theory and computations to experimental symposium : SEM 11 international congress & exposition on experimental and applied mechanics experimental mechanics applied to damage: detection, analysis and mitigation : Jun 2008, Orlando, FL.

11th international congress and exhibition on experimental and applied mechanics 2008 : June 2-5, 2008 : Orlando, Florida, USA. : 9th international symposium on MEMS and nanotechnology : international symposium of electronics/MEMS packaging and reliability : international symposium on optical metrology in industrial, medical, and daily life applications : linking theory and computations to experimental symposium : SEM 11 international congress & exposition on experimental and applied mechanics experimental mechanics applied to damage: detection, analysis and mitigation : Jun 2008, Orlando, FL.

Call No. (NDL): M17-09-540
Bibliographic ID of National Diet Library: 000009758508

Material type: 図書

Author: International Congress and Exhibition on Experimental and Applied Mechanics (11th : 2008 : Orlando, Fla.)

Publisher: Society for Experimental Mechanics

Publication date: [2008]

Material Format: Paper

Capacity, size, etc.: 4 v. : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN (set): 9781605604152 (set)
Title: 11th international congress and exhibition on experimental and applied mechanics 2008 : June 2-5, 2008 : Orlando, Florida, USA. : 9th international symposium on MEMS and nanotechnology : international symposium of electronics/MEMS packaging and reliability : international symposium on optical metrology in industrial, medical, and daily life applications : linking theory and computations to experimental symposium : SEM 11 international congress & exposition on experimental and applied mechanics experimental mechanics applied to damage: detection, analysis and mitigation : Jun 2008, Orlando, FL.
Author Heading: International Congress and Exhibition on Experimental and Applied Mechanics (11th : 2008 : Orlando, Fla.)
Publication, Distribution, etc.: Bethel : Society for Experimental Mechanics
Publication Date: [2008]
Publication Date (W3CDTF): 2008
Extent: 4 v. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Mechanics, Applied -- Congresses.
LCC: TA349
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-09-540
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000009758508
http://id.ndl.go.jp/bib/000009758508
OCLC No.: 262583848
https://www.worldcat.org/oclc/262583848
Bibliographic Record Category (NDL): 215