Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.

• 資料種別: 図書
• ISBN: 1424410142 (softbound ed.); 9781424410149 (ISBN-13 : softbound ed.)
• タイトル: Proceedings of the 14th international symposium on the physical & failure analysis of integrated circuits : IPFA 2007. : IPFA 2007 tutorial : Jul 2007, Bangalore, India.
• 著者標目: IEEE ED/SSC Chapter, Bangalore.; Mahapatra, Souvik.; Radhakrishnan, M. K.; International Symposium on the Physical & Failure Analysis of Integrated Circuits (14th : 2007 : Indian Institute of Science)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2007.
• 出版年（W3CDTF）: 2007
• 数量: 309 p. : ill. ; 28 cm.
• 並列タイトル等: Proceedings of the 14th international symposium on the physical and failure analysis of integrated circuits : IPFA 2007; 2007 14th international symposium on the physical and failure analysis of integrated circuit : IPFA 2007 : Bangalore, India : 11-13 July 2007
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Reliability -- Congresses.
• LCC: TK7874
• DDC: 621.3815/48
• NDLC: M17
• 一般注記: Papers.; IEEE cat no 07TH8945 (t.p. verso) , CFP07777-PRT (cover & spine) .
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-09-1411
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010075633; http://id.ndl.go.jp/bib/000010075633
• LC control number: 2007920884; https://lccn.loc.gov/2007920884
• OCLC番号: 256530019; https://www.worldcat.org/oclc/256530019
• 整理区分コード: 215