数量1 v. (various pagings) : ill. (some col.) ; 28 cm.
並列タイトル等3-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA
Proceedings : IS&T/SPIE electronic imaging science and technology
Proceedings : electronic imaging science and technology
一般注記Papers.
"3D Imaging Metrology is one of 24 technical conferences that are featured at the joint annual symposium of IS&T and SPIE, (...) " -- introd.
書誌注記Includes bibliographical references and author index.