Three-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA. : 1st conference on 3D imaging metrology : joint annual symposium of IS&T and SPIE : SPIE-IS&T electronic imaging : Jan 2009, San Jose, CA.

• 資料種別: 図書
• ISBN: 9780819474896
• ISSN（シリーズ）: 0277-786X
• タイトル: Three-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA. : 1st conference on 3D imaging metrology : joint annual symposium of IS&T and SPIE : SPIE-IS&T electronic imaging : Jan 2009, San Jose, CA.
• シリーズタイトル: SPIE Proceedings ; 7239
• タイトル標目: Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.; Proceedings of SPIE -- the International Society for Optical Engineering ; v. 7239.
• 著者標目: Beraldin, Jean Angelo, 1960-
• 出版事項: Bellingham : SPIE; Springfield : IS&T
• 出版年月日等: c2009.
• 出版年（W3CDTF）: 2009
• 数量: 1 v. (various pagings) : ill. (some col.) ; 28 cm.
• 並列タイトル等: 3-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA; Proceedings : IS&T/SPIE electronic imaging science and technology; Proceedings : electronic imaging science and technology
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Three-dimensional display systems -- Congresses.; Lasers -- Congresses.; Measurement -- Congresses.; Triangulation -- Congresses.; Engineering inspection -- Congresses.
• LCC: TK8315
• NDLC: M17
• 一般注記: Papers.; "3D Imaging Metrology is one of 24 technical conferences that are featured at the joint annual symposium of IS&T and SPIE, (...) " -- introd.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-09-1552
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010109740; http://id.ndl.go.jp/bib/000010109740
• OCLC番号: 316574519; https://www.worldcat.org/oclc/316574519
• 整理区分コード: 215