Three-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA. : 1st conference on 3D imaging metrology : joint annual symposium of IS&T and SPIE : SPIE-IS&T electronic imaging : Jan 2009, San Jose, CA. (SPIE Proceedings ; 7239)

Three-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA. : 1st conference on 3D imaging metrology : joint annual symposium of IS&T and SPIE : SPIE-IS&T electronic imaging : Jan 2009, San Jose, CA.

(SPIE Proceedings ; 7239)

Call No. (NDL): M17-09-1552
Bibliographic ID of National Diet Library: 000010109740

Material type: 図書

Author: Beraldin, Jean Angelo, 1960-

Publisher: SPIE

Publication date: c2009.

Material Format: Paper

Capacity, size, etc.: 1 v. (various pagings) : ill. (some col.) ; 28 cm.

NDC: -

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Note (General)：: Papers."3D Imaging Metrology is one of 24 technical conferences that are featured at the joint annual symposium of IS&T and SPIE, (...) " -- introd.

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Paper

Material Type: 図書
ISBN: 9780819474896
ISSN (series): 0277-786X
Title: Three-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA. : 1st conference on 3D imaging metrology : joint annual symposium of IS&T and SPIE : SPIE-IS&T electronic imaging : Jan 2009, San Jose, CA.
Series Title: SPIE Proceedings ; 7239
Title Heading: Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.
Proceedings of SPIE -- the International Society for Optical Engineering ; v. 7239.
Author Heading: Beraldin, Jean Angelo, 1960-
Publication, Distribution, etc.: Bellingham : SPIE
Springfield : IS&T
Publication Date: c2009.
Publication Date (W3CDTF): 2009
Extent: 1 v. (various pagings) : ill. (some col.) ; 28 cm.
Alternative Title: 3-dimensional imaging metrology : 19-20 January 2009 : San Jose, California, USA
Proceedings : IS&T/SPIE electronic imaging science and technology
Proceedings : electronic imaging science and technology
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Three-dimensional display systems -- Congresses.
Lasers -- Congresses.
Measurement -- Congresses.
Triangulation -- Congresses.
Engineering inspection -- Congresses.
LCC: TK8315
NDLC: M17
Note (General): Papers.
"3D Imaging Metrology is one of 24 technical conferences that are featured at the joint annual symposium of IS&T and SPIE, (...) " -- introd.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-09-1552
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010109740
http://id.ndl.go.jp/bib/000010109740
OCLC No.: 316574519
https://www.worldcat.org/oclc/316574519
Bibliographic Record Category (NDL): 215