Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. : symposium A, "performance and reliability of semiconductor devices" : 2008 MRS fall meeting : Nov 2008, Boston, MA.

• 資料種別: 図書
• ISBN: 9781605110806
• タイトル: Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. : symposium A, "performance and reliability of semiconductor devices" : 2008 MRS fall meeting : Nov 2008, Boston, MA.
• シリーズタイトル: Materials Research Society Symposia Proceedings ; 1108
• タイトル標目: Materials Research Society symposia proceedings ; v. 1108.
• 著者標目: Mastro, Michael, 1949-; Materials Research Society. Meeting (2008 : Boston, Mass.); Symposium A, "Performance and Reliability of Semiconductor Devices" (2008 : Boston, Mass.)
• 出版事項: Warrendale : Materials Research Society
• 出版年月日等: c2009.
• 出版年（W3CDTF）: 2009
• 数量: xiii, 259 p. : ill. ; 24 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Semiconductors -- Congresses.; Semiconductors -- Defects -- Congresses.; Semiconductors -- Reliability -- Congresses.
• LCC: TK7871.85
• DDC: 621.3819
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and indexes.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-09-2121
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010227283; http://id.ndl.go.jp/bib/000010227283
• OCLC番号: 320436779; https://www.worldcat.org/oclc/320436779
• 整理区分コード: 215