図書

Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. : symposium A, "performance and reliability of semiconductor devices" : 2008 MRS fall meeting : Nov 2008, Boston, MA. (Materials Research Society Symposia Proceedings ; 1108)

Icons representing 図書

Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. : symposium A, "performance and reliability of semiconductor devices" : 2008 MRS fall meeting : Nov 2008, Boston, MA.

(Materials Research Society Symposia Proceedings ; 1108)

Call No. (NDL)
M17-09-2121
Bibliographic ID of National Diet Library
000010227283
Material type
図書
Author
Mastro, Michael, 1949-ほか
Publisher
Materials Research Society
Publication date
c2009.
Material Format
Paper
Capacity, size, etc.
xiii, 259 p. : ill. ; 24 cm.
NDC
-
View All

Notes on use

Note (General):

Papers.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
9781605110806
Publication, Distribution, etc.
Publication Date
c2009.
Publication Date (W3CDTF)
2009
Extent
xiii, 259 p. : ill. ; 24 cm.