2009 27th IEEE VLSI test symposium : VTS 2009 : proceedings : 3-7 May 2009 : Santa Cruz, CA, USA. : test technology education program : TTEP tutorials : TTTC test technology educational program (TTEP) 2009 : May 2009, Santa Cruz, CA.

• 資料種別: 図書
• ISBN: 9780769535982
• ISSN: 1093-0167
• タイトル: 2009 27th IEEE VLSI test symposium : VTS 2009 : proceedings : 3-7 May 2009 : Santa Cruz, CA, USA. : test technology education program : TTEP tutorials : TTTC test technology educational program (TTEP) 2009 : May 2009, Santa Cruz, CA.
• 著者標目: IEEE VLSI Test Symposium (27th : 2009 : Santa Cruz, Calif.)
• 出版事項: Los Alamitos : IEEE Computer Society
• 出版年月日等: c2009.
• 出版年（W3CDTF）: 2009
• 数量: xxvii, 341 p. : ill. ; 28 cm.
• 並列タイトル等: 27th IEEE VLSI test symposium : proceedings : Santa Cruz, CA, USA : 3-7 May 2009; VLSI : IEEE test symposium 2009 : without testing it's a gamble; VTS09 : 27th IEEE VLSI test symposium
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
• NDLC: M17
• 一般注記: Abstracts and papers.; "Welcome to VTS 2009, the twenty-seventh in a series of annual symposia (...) " -- foreword.; "This year the Workshop on Test of Wireless Circuits and Systems will take place in conjunction with VTS for the second year." -- foreword.; "Two tutorials are offered (...) " -- foreword.; IEEE cat no P3598, CFP09029-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-10-911
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010551915; http://id.ndl.go.jp/bib/000010551915
• OCLC番号: 401340818; https://www.worldcat.org/oclc/401340818
• 整理区分コード: 215