2009 27th IEEE VLSI test symposium : VTS 2009 : proceedings : 3-7 May 2009 : Santa Cruz, CA, USA. : test technology education program : TTEP tutorials : TTTC test technology educational program (TTEP) 2009 : May 2009, Santa Cruz, CA.

2009 27th IEEE VLSI test symposium : VTS 2009 : proceedings : 3-7 May 2009 : Santa Cruz, CA, USA. : test technology education program : TTEP tutorials : TTTC test technology educational program (TTEP) 2009 : May 2009, Santa Cruz, CA.

Call No. (NDL): M17-10-911
Bibliographic ID of National Diet Library: 000010551915

Material type: 図書

Author: IEEE VLSI Test Symposium (27th : 2009 : Santa Cruz, Calif.)

Publisher: IEEE Computer Society

Publication date: c2009.

Material Format: Paper

Capacity, size, etc.: xxvii, 341 p. : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Abstracts and papers."Welcome to VTS 2009, the twenty-seventh in a series of annual symposia (...) " -- foreword."This year the Workshop on Test of Wi...

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Paper

Material Type: 図書
ISBN: 9780769535982
ISSN: 1093-0167
Title: 2009 27th IEEE VLSI test symposium : VTS 2009 : proceedings : 3-7 May 2009 : Santa Cruz, CA, USA. : test technology education program : TTEP tutorials : TTTC test technology educational program (TTEP) 2009 : May 2009, Santa Cruz, CA.
Author Heading: IEEE VLSI Test Symposium (27th : 2009 : Santa Cruz, Calif.)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2009.
Publication Date (W3CDTF): 2009
Extent: xxvii, 341 p. : ill. ; 28 cm.
Alternative Title: 27th IEEE VLSI test symposium : proceedings : Santa Cruz, CA, USA : 3-7 May 2009
VLSI : IEEE test symposium 2009 : without testing it's a gamble
VTS09 : 27th IEEE VLSI test symposium
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
NDLC: M17
Note (General): Abstracts and papers.
"Welcome to VTS 2009, the twenty-seventh in a series of annual symposia (...) " -- foreword.
"This year the Workshop on Test of Wireless Circuits and Systems will take place in conjunction with VTS for the second year." -- foreword.
"Two tutorials are offered (...) " -- foreword.
IEEE cat no P3598, CFP09029-PRT.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-10-911
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010551915
http://id.ndl.go.jp/bib/000010551915
OCLC No.: 401340818
https://www.worldcat.org/oclc/401340818
Bibliographic Record Category (NDL): 215