Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY.

• 資料種別: 図書
• ISBN: 9780735407121
• ISSN（シリーズ）: 0094-243X
• タイトル: Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY.
• シリーズタイトル: AIP Conference Proceedings ; 1173
• タイトル標目: AIP conference proceedings ; no. 1173.
• 著者標目: Seiler, David G.; International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2009 : Albany, N.Y.)
• 出版事項: Melville : American Institute of Physics
• 出版年月日等: 2009.
• 出版年（W3CDTF）: 2009
• 数量: xii, 398 p. : ill. ; 28 cm.
• 付属資料: With a CD-ROM.
• 並列タイトル等: Frontiers of characterization and metrology for nanoelectronics: 2009 : Albany, New York 11-15 May 2009
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Nanoelectronics -- Congresses.; Semiconductors -- Characterization -- Congresses.; Metal oxide semiconductors, Complementary -- Congresses.; Integrated circuits -- Ultra large scale integration -- Congresses.
• LCC: TK7874.84; TK7874.76
• DDC: 621.3815
• NDLC: M17
• 一般注記: Papers.; "The 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics was held (...) This was the seventh conference in a series; (...) " -- pref.
• 書誌注記: Includes bibliographical references and indexes.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-10-1269
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010612568; http://id.ndl.go.jp/bib/000010612568
• LC control number: 2009908727; https://lccn.loc.gov/2009908727
• OCLC番号: 463622722; https://www.worldcat.org/oclc/463622722
• 整理区分コード: 215