図書

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)

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Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY.

(AIP Conference Proceedings ; 1173)

Call No. (NDL)
M17-10-1269
Bibliographic ID of National Diet Library
000010612568
Material type
図書
Author
Seiler, David G.ほか
Publisher
American Institute of Physics
Publication date
2009.
Material Format
Paper
Capacity, size, etc.
xii, 398 p. : ill. ; 28 cm.
NDC
-
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Papers."The 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics was held (...) This was the seventh confe...

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Paper

Material Type
図書
ISBN
9780735407121
ISSN (series)
0094-243X
Title
Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY.
Series Title
AIP Conference Proceedings ; 1173
Title Heading
AIP conference proceedings ; no. 1173.
Author Heading
Seiler, David G.
International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2009 : Albany, N.Y.)
Publication, Distribution, etc.
Melville : American Institute of Physics
Publication Date
2009.
Publication Date (W3CDTF)
2009