2nd international workshop on defects in large software systems 2009 : (DEFECTS 2009) : Chicago, Illinois, USA : 19 July 2009. : Jul 2009, Chicago, IL.

• 資料種別: 図書
• ISBN: 9781615675173
• タイトル: 2nd international workshop on defects in large software systems 2009 : (DEFECTS 2009) : Chicago, Illinois, USA : 19 July 2009. : Jul 2009, Chicago, IL.
• 著者標目: Liblit, Ben.; Nagappan, Nachiappan.; Zimmermann, Thomas.; Workshop on Defects in Large Software Systems (2nd : 2009 : Chicago, Ill.)
• 出版事項: New York : Association for Computing Machinery
• 出版年月日等: c2009.
• 出版年（W3CDTF）: 2009
• 数量: 30 p. : ill. ; 28 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Software failures -- Congresses.; Computer system failures -- Congresses.; Computer software -- Quality control -- Congresses.; Computer software -- Congresses.
• NDLC: M17
• 一般注記: Papers and an abstract.; Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009) .
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-10-1409
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010626637; http://id.ndl.go.jp/bib/000010626637
• OCLC番号: 538274894; https://www.worldcat.org/oclc/538274894
• 整理区分コード: 215