2nd international workshop on defects in large software systems 2009 : (DEFECTS 2009) : Chicago, Illinois, USA : 19 July 2009. : Jul 2009, Chicago, IL.

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Note (General)：: Papers and an abstract.Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009) .

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Material Type: 図書
ISBN: 9781615675173
Title: 2nd international workshop on defects in large software systems 2009 : (DEFECTS 2009) : Chicago, Illinois, USA : 19 July 2009. : Jul 2009, Chicago, IL.
Author Heading: Liblit, Ben.
Nagappan, Nachiappan.
Zimmermann, Thomas.
Workshop on Defects in Large Software Systems (2nd : 2009 : Chicago, Ill.)
Publication, Distribution, etc.: New York : Association for Computing Machinery
Publication Date: c2009.
Publication Date (W3CDTF): 2009
Extent: 30 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Software failures -- Congresses.
Computer system failures -- Congresses.
Computer software -- Quality control -- Congresses.
Computer software -- Congresses.
NDLC: M17
Note (General): Papers and an abstract.
Held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2009) .
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-10-1409
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010626637
http://id.ndl.go.jp/bib/000010626637
OCLC No.: 538274894
https://www.worldcat.org/oclc/538274894
Bibliographic Record Category (NDL): 215