2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.

• 資料種別: 図書
• ISBN: 9781424439201
• ISSN: 1930-8841
• タイトル: 2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.
• 著者標目: International Integrated Reliability Workshop (2009 : S. Lake Tahoe, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2009.
• 出版年（W3CDTF）: 2009
• 数量: 181 p. : ill. ; 28 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Semiconductors -- Reliability -- Congresses.; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.; Integrated circuits -- Reliability -- Congresses.
• LCC: TK7874
• NDLC: M17
• 一般注記: Abstracts, papers and discussions.; Held at South Lake Tahoe, CA, USA.; "This year, we had an extensive educating tutorial program with 8 tutorials presented by world-class experts." -- foreword.; IEEE cat no CFP09IRW-PRT.
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-10-3653
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000010937743; http://id.ndl.go.jp/bib/000010937743
• OCLC番号: 613541678; https://www.worldcat.org/oclc/613541678
• 整理区分コード: 215