2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.

Author: International Integrated Reliability Workshop (2009 : S. Lake Tahoe, Calif.)

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Note (General)：: Abstracts, papers and discussions.Held at South Lake Tahoe, CA, USA."This year, we had an extensive educating tutorial program with 8 tutorials presen...

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Material Type: 図書
ISBN: 9781424439201
ISSN: 1930-8841
Title: 2009 IEEE international integrated reliability workshop final report : (IRW 2009) : South Lake Tahoe, California, USA : 18-22 October 2009. : IIRW 2009 : Oct 2009, ------.
Author Heading: International Integrated Reliability Workshop (2009 : S. Lake Tahoe, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2009.
Publication Date (W3CDTF): 2009
Extent: 181 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors -- Reliability -- Congresses.
Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
Integrated circuits -- Reliability -- Congresses.
LCC: TK7874
NDLC: M17
Note (General): Abstracts, papers and discussions.
Held at South Lake Tahoe, CA, USA.
"This year, we had an extensive educating tutorial program with 8 tutorials presented by world-class experts." -- foreword.
IEEE cat no CFP09IRW-PRT.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-10-3653
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000010937743
http://id.ndl.go.jp/bib/000010937743
OCLC No.: 613541678
https://www.worldcat.org/oclc/613541678
Bibliographic Record Category (NDL): 215