Stress-induced phenomena in metallization : eleventh international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010. : Apr 2010, Bad Schandau, Germany.

• 資料種別: 図書
• ISBN: 9780735408555
• ISSN（シリーズ）: 0094-243X
• タイトル: Stress-induced phenomena in metallization : eleventh international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010. : Apr 2010, Bad Schandau, Germany.
• シリーズタイトル: AIP Conference Proceedings ; 1300
• タイトル標目: AIP conference proceedings ; no. 1300.
• 著者標目: Zschech, Ehrenfried.; Ho, P. S.; Ogawa, Shinʾichi.; International Workshop on Stress-Induced Phenomena in Metallization (11th : 2010 : Bad Schandau, Germany)
• 出版事項: Melville : American Institute of Physics
• 出版年月日等: 2010.
• 出版年（W3CDTF）: 2010
• 数量: xi, 257 p. : ill. (some col.) ; 25 cm.
• 並列タイトル等: Stress-induced phenomena in metallization : 11th international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Interconnects (Integrated circuit technology) -- Defects -- Congresses.; Metal-metal bonds -- Congresses.; Strength of materials -- Congresses.; Nanostructured materials -- Congresses.; Semiconductors -- Congresses.; Copper -- Electric properties -- Congresses.
• LCC: QC1
• NDLC: M17
• 一般注記: Papers.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-11-1386
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011124475; http://id.ndl.go.jp/bib/000011124475
• OCLC番号: 699514242; https://www.worldcat.org/oclc/699514242
• 整理区分コード: 215