Stress-induced phenomena in metallization : eleventh international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010. : Apr 2010, Bad Schandau, Germany.

• Material Type: 図書
• ISBN: 9780735408555
• ISSN (series): 0094-243X
• Title: Stress-induced phenomena in metallization : eleventh international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010. : Apr 2010, Bad Schandau, Germany.
• Series Title: AIP Conference Proceedings ; 1300
• Title Heading: AIP conference proceedings ; no. 1300.
• Author Heading: Zschech, Ehrenfried.; Ho, P. S.; Ogawa, Shinʾichi.; International Workshop on Stress-Induced Phenomena in Metallization (11th : 2010 : Bad Schandau, Germany)
• Publication, Distribution, etc.: Melville : American Institute of Physics
• Publication Date: 2010.
• Publication Date (W3CDTF): 2010
• Extent: xi, 257 p. : ill. (some col.) ; 25 cm.
• Alternative Title: Stress-induced phenomena in metallization : 11th international workshop on stress-induced phenomena in metallization : Bad Schandau, Germany 12-14 April 2010
• Place of Publication (Country Code): US
• Text Language Code: eng
• Subject Heading: Interconnects (Integrated circuit technology) -- Defects -- Congresses.; Metal-metal bonds -- Congresses.; Strength of materials -- Congresses.; Nanostructured materials -- Congresses.; Semiconductors -- Congresses.; Copper -- Electric properties -- Congresses.
• LCC: QC1
• NDLC: M17
• Note (General): Papers.
• Note (Bibliography): Includes bibliographical references and author index.
• Holding library: 国立国会図書館
• Call No.: M17-11-1386
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000011124475; http://id.ndl.go.jp/bib/000011124475
• OCLC No.: 699514242; https://www.worldcat.org/oclc/699514242
• Bibliographic Record Category (NDL): 215