2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.

• 資料種別: 図書
• ISBN: 9781424485215
• ISSN: 1930-8841
• タイトル: 2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.
• 著者標目: International Integrated Reliability Workshop (2010 : S. Lake Tahoe, Calif.)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2010.
• 出版年（W3CDTF）: 2010
• 数量: ix, 180 p. : ill. ; 27 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Semiconductors -- Reliability -- Congresses.; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.; Integrated circuits -- Reliability -- Congresses.
• NDLC: M17
• 一般注記: Abstracts, papers, discussions and a presentation.; Held at S. Lake Tahoe, CA, USA.; "This year, we had extensive learning opportunities with (...) 6 tutorials (...) " -- foreword.; IEEE cat no CFP10IRW-PRT.
• 書誌注記: Includes bibliographical references.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-11-3261
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011224491; http://id.ndl.go.jp/bib/000011224491
• OCLC番号: 739977610; https://www.worldcat.org/oclc/739977610
• 整理区分コード: 215