2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.

Author: International Integrated Reliability Workshop (2010 : S. Lake Tahoe, Calif.)

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Note (General)：: Abstracts, papers, discussions and a presentation.Held at S. Lake Tahoe, CA, USA."This year, we had extensive learning opportunities with (...) 6 tuto...

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Material Type: 図書
ISBN: 9781424485215
ISSN: 1930-8841
Title: 2010 IEEE international integrated reliability workshop final report : (IRW 2010) : S. Lake Tahoe, California, USA : 17-21 October 2010. : IIRW 2010 : Oct 2010, ------.
Author Heading: International Integrated Reliability Workshop (2010 : S. Lake Tahoe, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2010.
Publication Date (W3CDTF): 2010
Extent: ix, 180 p. : ill. ; 27 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors -- Reliability -- Congresses.
Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses.
Integrated circuits -- Reliability -- Congresses.
NDLC: M17
Note (General): Abstracts, papers, discussions and a presentation.
Held at S. Lake Tahoe, CA, USA.
"This year, we had extensive learning opportunities with (...) 6 tutorials (...) " -- foreword.
IEEE cat no CFP10IRW-PRT.
Note (Bibliography): Includes bibliographical references.
Holding library: 国立国会図書館
Call No.: M17-11-3261
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000011224491
http://id.ndl.go.jp/bib/000011224491
OCLC No.: 739977610
https://www.worldcat.org/oclc/739977610
Bibliographic Record Category (NDL): 215