2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.

• 資料種別: 図書
• ISBN: 9781424469123; 9781424469154
• タイトル: 2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.
• 著者標目: IEEE International Conference on Microelectronic Test Structures (2010 : Hiroshima-shi, Japan)
• 出版事項: Piscataway : IEEE
• 出版年月日等: c2010.
• 出版年（W3CDTF）: 2010
• 数量: 235 p. : ill. ; 27 cm.
• 出版地（国名コード）: US
• 本文の言語コード: eng
• 件名標目: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.
• LCC: TK7874
• NDLC: M17
• 一般注記: Program and papers.; "This is the 23rd anniversary of the ICMTS (...) " -- chairman's letter.; IEEE cat no CFP10MTS-PRT.
• 書誌注記: Includes bibliographical references and author index.
• 所蔵機関: 国立国会図書館
• 請求記号: M17-11-2929
• 連携機関・データベース: 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• 書誌ID（NDLBibID）: 000011225987; http://id.ndl.go.jp/bib/000011225987
• OCLC番号: 678195511; https://www.worldcat.org/oclc/678195511
• 整理区分コード: 215