図書

2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.

Icons representing 図書

2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.

Call No. (NDL)
M17-11-2929
Bibliographic ID of National Diet Library
000011225987
Material type
図書
Author
IEEE International Conference on Microelectronic Test Structures (2010 : Hiroshima-shi, Japan)
Publisher
IEEE
Publication date
c2010.
Material Format
Paper
Capacity, size, etc.
235 p. : ill. ; 27 cm.
NDC
-
View All

Notes on use

Note (General)：

Program and papers."This is the 23rd anniversary of the ICMTS (...) " -- chairman's letter.IEEE cat no CFP10MTS-PRT.

Search by Bookstore

Search by Bookstore

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN
9781424469123
9781424469154
Title
2010 international conference on microelectronic test structures : (ICMTS 2010) : Hiroshima, Japan : 22-25 March 2010. : IEEE international conference on microelectronic test structures : Mar 2010, Hiroshima, Japan.
Author Heading
IEEE International Conference on Microelectronic Test Structures (2010 : Hiroshima-shi, Japan)
Publication, Distribution, etc.
Piscataway : IEEE
Publication Date
c2010.
Publication Date (W3CDTF)
2010
Extent
235 p. : ill. ; 27 cm.
Place of Publication (Country Code)
US
Text Language Code
eng